JPS55144531A - Detecting method of chipped of tablet - Google Patents

Detecting method of chipped of tablet

Info

Publication number
JPS55144531A
JPS55144531A JP5228079A JP5228079A JPS55144531A JP S55144531 A JPS55144531 A JP S55144531A JP 5228079 A JP5228079 A JP 5228079A JP 5228079 A JP5228079 A JP 5228079A JP S55144531 A JPS55144531 A JP S55144531A
Authority
JP
Japan
Prior art keywords
tablets
image
film
cutout
cross sectional
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5228079A
Other languages
English (en)
Japanese (ja)
Other versions
JPH026020B2 (en]
Inventor
Akio Aoyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CKD Corp
Original Assignee
CKD Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CKD Corp filed Critical CKD Corp
Priority to JP5228079A priority Critical patent/JPS55144531A/ja
Publication of JPS55144531A publication Critical patent/JPS55144531A/ja
Publication of JPH026020B2 publication Critical patent/JPH026020B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP5228079A 1979-04-27 1979-04-27 Detecting method of chipped of tablet Granted JPS55144531A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5228079A JPS55144531A (en) 1979-04-27 1979-04-27 Detecting method of chipped of tablet

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5228079A JPS55144531A (en) 1979-04-27 1979-04-27 Detecting method of chipped of tablet

Publications (2)

Publication Number Publication Date
JPS55144531A true JPS55144531A (en) 1980-11-11
JPH026020B2 JPH026020B2 (en]) 1990-02-07

Family

ID=12910374

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5228079A Granted JPS55144531A (en) 1979-04-27 1979-04-27 Detecting method of chipped of tablet

Country Status (1)

Country Link
JP (1) JPS55144531A (en])

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5811819A (ja) * 1981-07-15 1983-01-22 Nomura Sangyo Kk 色彩選別方法
JPS5923248A (ja) * 1982-07-29 1984-02-06 Satake Eng Co Ltd 米粒の胴割検出装置
JPS59135080A (ja) * 1983-01-24 1984-08-03 住友ゴム工業株式会社 ボ−ルのスタンプ判別方法
JPS6033036A (ja) * 1983-08-02 1985-02-20 Ckd Corp 錠剤の欠け検出装置
JPS61165646A (ja) * 1985-01-17 1986-07-26 Shin Meiwa Ind Co Ltd 端子圧着電線の端子圧着部検査装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
OMRON TECHNICS56 *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5811819A (ja) * 1981-07-15 1983-01-22 Nomura Sangyo Kk 色彩選別方法
JPS5923248A (ja) * 1982-07-29 1984-02-06 Satake Eng Co Ltd 米粒の胴割検出装置
JPS59135080A (ja) * 1983-01-24 1984-08-03 住友ゴム工業株式会社 ボ−ルのスタンプ判別方法
JPS6033036A (ja) * 1983-08-02 1985-02-20 Ckd Corp 錠剤の欠け検出装置
JPS61165646A (ja) * 1985-01-17 1986-07-26 Shin Meiwa Ind Co Ltd 端子圧着電線の端子圧着部検査装置

Also Published As

Publication number Publication date
JPH026020B2 (en]) 1990-02-07

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